Project Overview

An Asian electronics manufacturer sought information on nanometer scale defect detection technology, applicable to ultra-thin inorganic layers and encapsulation of polymer-based solid-state electronic devices.

Samples were identified with different types of defects, including 1) micro-particles embedded in the OLED pattern, 2) dead pixels without any visible defects, 3) other almost invisible defects, etc.

Terahertz (THz) scanning imaging technology was used to examine the samples, the results were interpreted, and recommendations made. 

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